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R&D Awards

Advanced Light Source (ALS) LBNL2012Simon Morton and Jeff Dickert for the development of the Compact Variable Collimator (CVC). The CVC, installed at the ALS  Berkeley Center for Structural Biology (BCSB) beamlines, is small, easy to use and readily adapted to any configuration of an x-ray beamline where it allows researchers to quickly and accurately adjust X-ray beams for protein crystallography, x-ray microscopy and small angle x-ray scattering to optimize resolution.
Advanced Light Source (ALS) LBNL2010Miguel Salmeron, Hendrik Bluhm, Zahid Hussain and Frank Ogletree for 'APPELS: Differentially Pumped Ambient Pressure PhotoElectron Lens System for Photoemission Studies'
Advanced Photon Source (APS) ANL2009The hard X-ray nanoprobe - A new device provides X-ray imaging and analysis at a spatial resolution previously not available in the hard X-ray range. The system also provides qualitative new characterization capabilities by combining full field transmission imaging with scanning probe capabilities. This technology will significantly improve the ability of medical scientists and nanoscientists to study use of nanocomposites in tissues, cells and subscellular organelles, which helps develop new medical imaging techniques and therapies. (Jointly with Xradia Inc)
Advanced Photon Source (APS) ANL2009Multilayer lens wafers for X-ray lenses, providing the ability to  focus hard X-rays well below 100 nanometers with high efficiency.   This linear Fresnel lens may be used to develop smaller, better- performing and more reliable computers and telecommunications equipment; to produce lighter, sturdier, safer transportation vehicles through advanced materials with tailored properties; to detect flaws or strains in materials for storage, machining and aviation; and to image cell division and tumor growth, providing a new mechanism for the early detection of cancer.
Spallation Neutron Source (SNS) ORNL2007Pharos Neutron Detector System, developed by Richard Riedel of ORNL's Neutron Scattering Science Division, Ronald Cooper of the Neutron Facilities Development Division and Lloyd Clonts of the Engineering Science and Technology Division.  Pharos is a small low-power neutron detection system that can be used to identify nuclear materials at airports and harbors. Pharos can determine from what direction and distance neutrons come from, allowing it to track targets after they have been identified. It has large-area detector coverage, extremely low power requirements and digital communication capability.
Advanced Photon Source (APS) ANL2006Multilayer lens wafers for X-ray lenses, providing the ability to  focus hard X-rays well below 100 nanometers with high efficiency.   This linear Fresnel lens may be used to develop smaller, better- performing and more reliable computers and telecommunications.
High Temperature Materials Laboratory (HTML) ORNL2006Metal Infusion Surface Treatment (MIST) is an advanced, low-cost infused coating technology. The process takes any of 58 desired periodic table elements, or combinations thereof, into a formulation, which is then applied to non-organic materials. With a simple spray or dip and low heat treatment, the various elements and their unique properties are diffused into surfaces, along with a 0.1- to 0.5-µm infusion coating. The result is a uniform, durable nanothin film treatment that delivers improved physical properties.
National Synchrotron Light Source II (NSLS II) BNL2006A device, the first able to focus a large spread of high-energy x-rays, that can be used in about 100 beamline facilities around the world to conduct scientific research in physics, biology and nanotechnology.
Advanced Photon Source (APS) ANL2005Anti-scatter grids for X-ray imaging and collimators for nuclear imaging, developed jointly with Creatv MicroTech, Inc.
National High Magnetic Field Laboratory (Maglab) Florida State University2005Developed jointly with Keithley Instruments, the 6221/2182A AC and DC Precision Current Source with Nanovoltmeter helps engineers and product developers create breakthrough consumer products and medical devices that can improve characteristics of many of the devices used for fiber optic communications and almost all modern microelectronics. The increased capabilities of the instruments also help find defects during the manufacturing process, rather than after.
National Synchrotron Light Source II (NSLS II) BNL1999Development of an x-ray microscope that makes it possible to image specimens at extremely cold temperatures — around 110 Kelvin, or –165 degrees Celsius.
National Synchrotron Light Source II (NSLS II) BNL1997A device that simultaneously detects visible, ultraviolet, and near-infrared light, a capability that is important for various fluorescence research techniques used in diverse scientific fields like biochemistry, structural biology, and solid-state physics.
National Synchrotron Light Source II (NSLS II) BNL1991Development of a high-resolution scanning photoelectron x-ray microscope that uses soft x-rays from the NSLS to provide element-specific images of features as small as 0.1 micrometers – a capability important for studying materials ranging from microcircuits to cell nuclei. 
National Synchrotron Light Source II (NSLS II) BNL1990Creation of a device that splits light from an infrared source into two beams, one of which passes through the sample. When the beams are recombined, an interference pattern results, giving information about the sample – useful for catalysis and corrosion studies at the molecular scale.
National Synchrotron Light Source II (NSLS II) BNL1989The development of a real-time, harmonic closed-orbit feedback system, designed to stabilize the orbits of the electron beams circulating at nearly the speed of light within the two synchrotrons at the NSLS. It has since been installed in electron-storage rings around the world.
National Synchrotron Light Source II (NSLS II) BNL1988The development of a collimated x-ray microprobe/microscope, a unique instrument for nondestructive determination of trace element contents in materials with very small areas. With this device, concentrations of elements from silicon to uranium can be determined down to the level of one million atoms in 10 billionths of a gram (about 1 to 10 parts in 100 million).
National Synchrotron Light Source II (NSLS II) BNL1988The development of a high-resolution soft x-ray monochromator at the NSLS, which provided tunability, high resolution, and high flux in the soft x-ray region.
National Synchrotron Light Source II (NSLS II) BNL1986The development of a soft x-ray emission spectrometer for use with synchrotron radiation, the first of its kind.